000 00504nam a22001817a 4500
005 20241003111941.0
008 170202b xxu||||| |||| 00| 0 eng d
020 _a9781118479292
040 _cPK-LaUMT
082 _a621.3815
_bIBE-T
100 _aIbe, Eishi H.
_92487
245 _aTerrestrial radiation effects in ULSI devices and electronic systems/
_cEishi H. ibe
260 _aSingopore:
_bWiley,
_c2015
300 _a268 p.
546 _aen
650 _aElectronic circuits
_92488
942 _cBK
999 _c90746
_d90746