Jayanthy, S. creator Bhuvaneswari, M. C. text Singapore Springer 2019 monographic eng

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xi, 156 p. This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing by S. Jayanthy and M. C. Bhuvaneswari Includes bibliographical references Eng Microprogramming Logic design Circuits and system 621.3815 JAY-T 9789811324925 260407 20260408155351.0