VLSI testing digital and mixed analogue/digital techniques Stanley L. Hurst
Material type:
TextPublication details: Hoboken,USA: IEEE Press, 1998Description: 532 pISBN: - 0-85296-901-5
- 621.395 HUR-V
Books
| Current library | Call number | Status | Barcode | |
|---|---|---|---|---|
| UMT Main Campus | 621.395 HUR-V (Browse shelf(Opens below)) | Available | 38011 |
Browsing UMT Main Campus shelves Close shelf browser (Hides shelf browser)
| No cover image available | ||||||||
| 621.395 HIL-C Computer aided logical design with emphasis on VLSI | 621.395 HOL-D Design of VLSI gate array ICs | 621.395 HOL-D Digital logic design/ | 621.395 HUR-V VLSI testing | 621.395 HWA-D Digital logic and microprocessor design with VHDL | 621.395 KAT-C Contemporary logic design | 621.395 KLE-D Digital and microprocessor fundamentals: |
EN
There are no comments on this title.
Log in to your account to post a comment.